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Surface Analysis Equipment Product List and Ranking from 14 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Sep 02, 2026～Sep 29, 2026
This ranking is based on the number of page views on our site.

Surface Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 02, 2026～Sep 29, 2026
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. ザ・ブルーボアハウス Tokyo//Industrial Electrical Equipment
  3. 東邦化研 Saitama//Electronic Components and Semiconductors
  4. 4 セイコーフューチャークリエーション Chiba//Testing, Analysis and Measurement
  5. 5 アイテス Shiga//Electronic Components and Semiconductors
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Surface Analysis Equipment Product ranking

Last Updated： Aggregation Period:Sep 02, 2026～Sep 29, 2026
This ranking is based on the number of page views on our site.

  1. Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld ザ・ブルーボアハウス
  2. [Analysis Case] Evaluation of Coating Film on Injection Needle Surface 一般財団法人材料科学技術振興財団　MST
  3. [Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness 一般財団法人材料科学技術振興財団　MST
  4. [Analysis Case] Investigation of Contamination Causes on Silicon Wafers 一般財団法人材料科学技術振興財団　MST
  5. 4 [Analysis Case] Distribution and State Evaluation of OH on Aluminum (Al) Surface 一般財団法人材料科学技術振興財団　MST

Surface Analysis Equipment Product List

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Kitano Seiki Co., Ltd. Technical Services for Vacuum and Experimental Equipment

Kitano Seiki Co., Ltd. Technical Services for Vacuum and Experimental Equipment

Feel free to contact us about any device, regardless of the manufacturer!

To ensure that our customers can use our products with peace of mind, a reliable support system is essential. At Kitano Seiki, we have established a comprehensive support system to maintain the best condition of the equipment used by our customers. We provide services that meet the usage environment and various needs of our customers at appropriate costs. 【Various Equipment and Units】 ○ Deposition Equipment (MBE, CVD, EB, Sputtering, etc.) ○ Analysis Equipment (STM, FIM, TEM, AES, etc.) ○ Various Manipulators ○ Various Sample Transport Mechanisms For more details, please contact us or download the catalog.

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Graphene crystal thin film and surface analysis equipment

Graphene crystal thin film and surface analysis equipment

It is composed of MBE film formation mechanisms, surface thermal analysis mechanisms, and RHRRD crystal structure analysis systems!

The product is an in-situ system that combines the growth mechanism of graphene crystal thin films using "MBE method" and "surface thermal decomposition method" with RHEED/LEED surface analysis mechanisms. Using a 6H-SiC micro-tilted ([1-100] 4° off) substrate with a (0001) surface (Si face), the formation of graphene was confirmed through diffraction patterns during the growth of graphene. Additionally, the formation of graphene was also confirmed through micro-Raman measurements. 【Components】 ■ MBE deposition mechanism equipped with a "high-temperature K cell for graphene thin film growth" ■ Surface thermal analysis mechanism using a "heating holder for thermal decomposition of SiC substrate" ■ RHRRD crystal structure analysis system ■ LEED surface observation system *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices
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[Data] List of Analysis Machines

[Data] List of Analysis Machines

White interference-equipped laser microscopes and micro-Raman spectroscopic measurement devices, among others! A wide range of analytical instruments listed.

In this document, we present a list of various analytical instruments. Starting with the "High-Resolution Gas Chromatography Mass Spectrometry (HRGC/HRMS)," we also feature a wide range of instruments such as the "Ultra-Thin Film Scratch Tester" and the "Micro Vickers Hardness Tester." Additionally, the analysis items include "materials analysis-related" topics such as molecular weight distribution and separation analysis, as well as "environmental measurement analysis-related" topics like radiation measurement and odor analysis. Please feel free to download and take a look. 【Featured Equipment (Partial)】 ■ Ultra-High-Resolution Field Emission Scanning Electron Microscope - EDS (FE-SEM/EDS) ■ Scanning Electron Microscope - Energy Dispersive X-ray Spectroscopy (SEM-EDS) ■ Energy Dispersive X-ray Fluorescence Spectrometer (EDX) ■ Ultraviolet-Visible-Near Infrared Spectrometer (UV-VIS-NIR) ■ Fourier Transform Infrared Spectrometer (FT-IR) *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other environmental analysis equipment
  • Surface Analysis Equipment

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[Analysis Case] Evaluation of the Distribution of Hair Care Agent Components in Hair 2

[Analysis Case] Evaluation of the Distribution of Hair Care Agent Components in Hair 2

Visualizing the differences in penetrating ingredients and their distribution based on the type of hair care products used.

We analyzed the hair cross-sections of five individuals (A to E) who use different hair care products in their daily lives using TOF-SIMS. As a result, it was found that the types of hair care products lead to differences in the detected components and their distribution within the hair.

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[Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness

[Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

Stainless steel (SUS) is excellent in corrosion resistance and is used in various industrial products and components. Although it is a material resistant to corrosion, changes in the composition of the surface passive film due to aging or processing can lead to issues. In this instance, we introduce a case study analyzing the state of the metal oxide film on the surface of stainless steel using TOF-SIMS. TOF-SIMS allows for the high-sensitivity acquisition of molecular information in the oxide state, enabling the distribution of oxides ranging from a few nanometers to several tens of nanometers on the surface to be obtained, and spatial distribution can be evaluated through image analysis. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Evaluation of chemical bonding state, composition distribution, and thickness of corrosion layers For more details, please download the materials or contact us.

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[Analysis Case] Analysis of the Multilayer Structure of Polymer Films

[Analysis Case] Analysis of the Multilayer Structure of Polymer Films

Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.

The functionality of films is known to be determined by factors such as material, thickness, and layer structure. In this study, we evaluated the layer structure of polyethylene-based multilayer films commonly used as food wrap. By confirming that the film is primarily composed of polyethylene using FT-IR, and employing GCIB (Ar cluster) for sputtering, we were able to clearly visualize the structure where polyethylene and nylon 6 are layered within a thickness of 10μm through depth profiling with TOF-SIMS.

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[Analysis Case] Evaluation of Coating Film on Injection Needle Surface

[Analysis Case] Evaluation of Coating Film on Injection Needle Surface

Visualization of the distribution and coating condition of water-repellent films, coatings, and membranes.

Medical injection needles reduce puncture resistance and lessen the physical burden on patients by coating the surface of the metal tube with silicone. To maintain the performance of the needle, it is important that the entire surface is covered with a coating film. This report introduces a case where imaging analysis of the opening at the tip of the injection needle was conducted using TOF-SIMS to evaluate whether the coating film was applied. Since TOF-SIMS detects information from the very surface, it can assess the condition of the coating film without detecting the underlying elements.

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[Analysis Case] Qualitative Evaluation of Fiber Optic Core and Cladding

[Analysis Case] Qualitative Evaluation of Fiber Optic Core and Cladding

Qualitative and distribution evaluation of optical fiber materials is possible using TOF-SIMS.

Optical fibers have a structure that consists of a core with a high refractive index surrounded by a cladding layer with a low refractive index. Due to the difference in refractive indices, light is totally internally reflected at the boundary and transmitted. Therefore, it is important to analyze the selection of materials, the presence of impurities, adhesion, coating conditions, and contaminants. Optical fibers can be broadly classified into two types: plastic and quartz. This document presents a case study in which the materials of the core and cladding were identified by analyzing the cross-section of plastic optical fibers using TOF-SIMS. Measurement method: TOF-SIMS Product field: Optical fibers, electronic components Analysis purpose: Qualitative evaluation, organic matter evaluation, composition distribution evaluation "For more details, please download the document or contact us."

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[Analysis Case] Evaluation of the Imidization Reaction of Polyimide

[Analysis Case] Evaluation of the Imidization Reaction of Polyimide

The degree of imidization due to differences in heating conditions can be evaluated using XPS.

Polyimide has very high heat resistance and excellent electrical insulation and mechanical properties, making it an essential material not only for electronic components but also for a wide range of fields such as precision machinery, automobiles, and aerospace. In its reliability evaluation, research on imide bonds is important. This document presents an example of XPS measurements conducted on polyimide before and after heating. Changes in the amount of oxygen and the chemical shifts of carbon, nitrogen, and oxygen confirmed that imidization progressed after heating. Additionally, by performing waveform analysis, it is also possible to determine the proportion of polyimide present.

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[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

Evaluation of the distribution of organic components and active substances on the surface, qualitative analysis.

The segregation of components and the formation of films on the surface of the positive electrode of lithium-ion secondary batteries are factors that influence the electric capacity. We will introduce a case study on Li(NiCoMn)O2 (NCM), which is used as a positive electrode, where micro-region mapping was conducted using AES, and qualitative analysis of organic components (binder) and active material surface films was performed using XPS and TOF-SIMS. These methods allow for analysis with a series of treatments conducted under an Ar atmosphere, which helps to suppress the alteration of the sample.

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[Analysis Case] Qualitative Analysis of Paper Surface and Evaluation of Component Distribution

[Analysis Case] Qualitative Analysis of Paper Surface and Evaluation of Component Distribution

It is effective for checking the impact of packaging materials on samples and the residues before and after changes to equipment.

There are various colored products made from paper used as wrapping paper, which contain diverse components. Since these coloring components can affect adhesion to contact materials and cause contamination, it is important to understand the components of the paper surface. This document presents a case study investigating the components of paper surfaces with different colors using TOF-SIMS.

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  • Paper and pulp
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[Analysis Case] Simultaneous Qualitative Analysis of Inorganic and Organic Contaminants/Adhesives on Wafers

[Analysis Case] Simultaneous Qualitative Analysis of Inorganic and Organic Contaminants/Adhesives on Wafers

Simultaneous measurement of inorganic and organic components in minute specific areas.

TOF-SIMS has features such as simultaneous evaluation of organic and inorganic materials, capability for micro-area analysis, and high sensitivity for analyzing the very surface, making it effective for residue investigation in cleaning processes. An example is presented where pure water was dried on a silicon wafer. Optical microscopy only reveals slight point-like foreign substances and cloudiness. However, the results measured by TOF-SIMS showed that in the contaminated areas, organic components such as hydrocarbons, PDMS, and amides, which tend to adsorb naturally, were aggregated.

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  • Wafer
  • Memory
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Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

We have carefully selected case studies using XPS, AES, and AFM for discoloration investigation and surface modification evaluation. Please take a look and download the materials.

In this case study collection, we will introduce examples related to "surface analysis." We feature numerous characteristics and analysis cases, including "investigation of discoloration on material surfaces using XPS," "evaluation of surface modification of PET using XPS," "analysis of hydrophobic films using XPS," and "evaluation of heating effects on plated parts." Additionally, we present analysis results, discoloration investigations, surface modification evaluations, and analyses of hydrophobic films. We encourage you to read through it. [Contents] ■ Investigation of discoloration on material surfaces using XPS ■ Evaluation of surface modification of PET using XPS ■ Analysis of hydrophobic films using XPS ■ Evaluation of heating effects on plated parts (AFM, AES) *For more details, please refer to the PDF document or feel free to contact us.

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  • Other metal materials
  • Other polymer materials
  • Surface Analysis Equipment

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Evaluation of the heating effects on plated parts using AFM/AES Auger electron spectroscopy.

Evaluation of the heating effects on plated parts using AFM/AES Auger electron spectroscopy.

We will conduct a multifaceted investigation of heating effects on plated components using AFM scanning probe microscopy and AES Auger electron spectroscopy.

The AFM scanning probe microscope is a device that detects various physical interactions occurring between the probe and the sample surface, allowing for the observation of surface shapes in minute areas and the measurement of electrical and mechanical properties. These physical interactions include atomic forces, frictional forces, and electrostatic forces. Additionally, measurements can be conducted in various environments, including atmospheric and vacuum conditions, enabling the observation of sample surfaces regardless of whether they are conductive or insulating. The AES Auger electron spectrometer allows for elemental analysis of the extreme surface layer of materials (approximately 5nm) and investigation of concentration gradients in the depth direction. Using these two analytical devices, we conducted a study on the heating effects on the surface of plated connector contact pins. Please take a moment to read the PDF materials. Furthermore, in addition to these analytical devices, our company also conducts various surface analyses such as XPS and GD-OES. We would be happy to assist you, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

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  • Plating Equipment
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Book Surface and Depth Analysis Methods [New Edition]

Book Surface and Depth Analysis Methods [New Edition]

A clear explanation of surface analysis for developers and manufacturers who are not specialists in analysis!

○Publication Date: December 10, 2007 ○Format: B5 size, paperback, 618 pages ○Price: 33,000 yen (excluding tax) → STbook member price: 31,350 yen (excluding tax) First Edition: December 2007 This book is a revised edition of "Surface and Depth Analysis Methods," published in December 2007 (ISBN 978-4-903413-30-3), with updated binding and pricing. The content is the same as the 2007 publication, so please be careful not to make a mistake when purchasing. ○Authors: Hiroyoshi Soejima, Shimadzu Scientific Research Institute, Inc. / Takeshi Teratani, Sumika Chemical Analysis Service, Ltd. / Junichiro Murayama, Sumitomo Metal Technology, Ltd. / Shinji Nagamachi, Ion Engineering Research Institute, Inc. / Keizo Ishii, Tohoku University / Kazutoshi Kakita, Nippon Steel Technoresearch, Inc. / Makoto Nishino, Shimadzu Corporation / Makishi Ishikawa, Cameca Instruments, Inc. / Takahiro Hoshi, ULVAC, Inc. / Satoshi Kawata, SII Nanotechnology, Inc. / Satoshi Yoshimi, Shimadzu Comprehensive Analysis Testing Center / and 45 others.

  • Company：S&T出版
  • Price：10,000 yen-100,000 yen
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Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In many cases, the analysis targets in surface analysis are limited to those that can be maintained in a vacuum. On the other hand, by applying the potential of high-speed ions, it is possible to bring the analysis probe out to atmospheric pressure. At TRC, we examined Rutherford backscattering spectroscopy (RBS) at atmospheric pressure and succeeded in its realization. This paper reports on depth analysis of solid/liquid interfaces using atmospheric pressure RBS, evaluation of depth distribution of quantum dots in HeLa cells, and depth analysis of hydrogen in wet samples using atmospheric pressure RBS/HFS (hydrogen forward scattering analysis). **Table of Contents** 1. Introduction 2. Solid/Liquid Interface Analysis 3. Application to Biological Samples 4. Development of Measurement System at TRC: Atmospheric Pressure RBS/HFS Analysis 5. Conclusion

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Announcement of Exhibition Participation and Exhibitor Presentations "eX-Tech2026"

Announcement of Exhibition Participation and Exhibitor Presentations "eX-Tech2026"

We will be exhibiting at the eX-Tech 2026 microelectronics show within the JPCA Show 2026.

From June 10 (Wednesday) to June 12 (Friday), 2026, we will be exhibiting at the Microelectronics Show eX-Tech 2026, part of the Total Solutions Exhibition for Electronic Devices "JPCA Show 2026," held at Tokyo Big Sight, East Exhibition Hall.

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Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld

Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld

High-speed, easy, accurate, non-destructive surface contact angle analysis device. It measures surface energy (wetting properties) as a substitute for the dyne value.

The Surface Analyst 5001 from BrightSign USA is a handheld complete surface analysis device that allows manufacturers to quantify the quality of material surfaces for adhesion, coating, sealing, painting, printing, or cleaning applications by analyzing water contact angles. It is a standalone model (non-network specification) and is used for on-site handheld measurements. It can be used on a variety of materials, including webs (paper, film, carbon fiber composites) and 3D component materials (such as iron, aluminum, non-ferrous metals, and plastics).

  • Analytical Equipment and Devices
  • Other measurement, recording and measuring instruments
  • Surface Analysis Equipment

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Time-of-Flight Atomic Scattering Surface Analysis Device "TOFLAS-3000"

Time-of-Flight Atomic Scattering Surface Analysis Device "TOFLAS-3000"

Crystal orientation and polarity are clear in 15 minutes! Stable surface analysis is possible without the influence of charging!

The "TOFLAS-3000" is an atomic scattering surface analysis device that can simultaneously perform crystal structure and elemental analysis of solid surfaces such as metals, semiconductors, and insulators. This device has developed the coaxial direct collision ion scattering spectroscopy (CAICISS) method and uses an atom beam of electrically neutral He (Ne, Ar) as a probing tool, allowing for stable surface analysis without the influence of charging, even on insulators. In crystal surface structure analysis, a unique pattern specific to the crystal surface can be obtained by conducting a full-angle scan of the incident angle, making it visually easy to determine the surface structure. 【Features】 ■ Visualization of crystal orientation, symmetry, and the front and back of polar crystals * Easy distinction of the front and back of crystals with wurtzite structures (such as GaN and AlN) ■ Simple elemental analysis and crystal structure analysis for each layer near the surface * Analysis of ultra-thin films is also possible ■ When synchronized with pole figure simulation, it can be operated as if "seen in person" ■ No issues with orientation determination of insulating samples or organic molecular films ■ High-sensitivity evaluation of impurities through simultaneous measurement with SIMS (complementary to TOF spectra) * For more details, please refer to the PDF document or feel free to contact us. * We also accept analysis requests.

  • Analytical Equipment and Devices
  • Semiconductor inspection/test equipment
  • Surface Analysis Equipment

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Surface analysis device "Ultra High Vacuum Surface Structure Analysis Device"

Surface analysis device "Ultra High Vacuum Surface Structure Analysis Device"

A surface structure analysis device equipped with an EB evaporator suitable for the fabrication of metal thin films!

The "Ultra High Vacuum Surface Structure Analysis Device" is a surface analysis instrument capable of performing LEED diffraction patterns, Auger analysis, and temperature-programmed desorption analysis for semiconductors and model catalysts. The analyzer is equipped with a LEED/AES mass spectrometer and features an EB evaporator suitable for metal thin film fabrication. Please feel free to contact us if you have any inquiries. 【Specifications】 ■ Surface analysis system: LEED/AES ■ Evaporation source: Ultra high vacuum evaporator "AEV series" ■ Gas source: Hydrogen cracking gun "AEV series" ■ Sample heating: Direct electric heating type (TC contact type sample holder) ■ Sample manipulator: 5-axis operation with X, Y, Z, θ, and in-plane rotation axis, etc. *For more details, please contact us.

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Surface analysis of discolored and altered materials using XPS (ESCA).

Surface analysis of discolored and altered materials using XPS (ESCA).

Measures and avoidance of issues are possible! We will introduce examples verified through elemental and bonding state analysis.

Materials often undergo changes and discoloration depending on the usage environment. These changes and discoloration can lead to issues with the product's performance and design, but by understanding and clarifying the changes in molecular structure through chemical analysis, it becomes possible to address or avoid these problems. This document presents case studies that have been compared and verified through elemental and bonding state analysis via surface analysis. [Contents] ■ Analysis Samples ■ Elemental Analysis Results by XPS (ESCA) ■ Bonding State Analysis Results by XPS (ESCA) for Polycarbonate ■ Bonding State Analysis Results by XPS (ESCA) for Polyvinyl Chloride *For more details, please refer to the PDF document or feel free to contact us.

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[Analysis Case] Distribution and State Evaluation of OH on Aluminum (Al) Surface

[Analysis Case] Distribution and State Evaluation of OH on Aluminum (Al) Surface

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

The presence of OH and fluoride on the surface of aluminum electrodes is one of the causes of electrode corrosion, and investigating the state of the aluminum surface is essential for identifying the causes of defects. TOF-SIMS excels in depth resolution at the very surface and can measure depth distribution with high sensitivity while monitoring the state of inorganic substances. By evaluating the depth distribution along with OH, we discovered a phenomenon where OH increased without a change in the thickness of the oxide film. In this way, TOF-SIMS enables the evaluation of depth distribution of molecular information of inorganic substances that cannot be obtained through elemental analysis.

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[Analysis Case] Investigation of Contamination Causes on Silicon Wafers

[Analysis Case] Investigation of Contamination Causes on Silicon Wafers

Evaluation of contamination originating from gloves

In semiconductor device manufacturing, it is necessary to investigate what causes thin deposits that lead to defects in order to examine contamination processes. An analysis was conducted using TOF-SIMS on the deposits for which carbon was detected by EDX and quantified by XPS. When compared to the gloves used for standard samples in each process, similar trends were observed with gloves A and B. Furthermore, verification was performed by adhering the standard sample gloves to silicon wafers. As a result, it was found that they were similar to glove A. Adhering standard samples to silicon wafers for verification is an effective method.

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[Analysis Case] Evaluation of Wetting Properties of Ceramics

[Analysis Case] Evaluation of Wetting Properties of Ceramics

It is possible to analyze organic substances characteristic of hydrophilic and hydrophobic areas of inorganic materials.

Ceramics are inorganic compound materials widely used in everyday items and electronic components. They possess characteristics such as heat resistance and chemical resistance, and evaluating the surface condition is important for utilizing the functions of ceramics. This document introduces a case where the cause of decreased hydrophobicity in Zr oxide ceramic materials with hydrophobic surface treatment was evaluated using TOF-SIMS. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Composition evaluation and identification For more details, please download the document or contact us.

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[Analysis Case] Component Evaluation of Positive and Negative Electrode Binders in Secondary Batteries

[Analysis Case] Component Evaluation of Positive and Negative Electrode Binders in Secondary Batteries

Identification of organic substances using TOF-SIMS and GS/MS.

The binder for lithium-ion secondary batteries not only serves as an adhesive between active materials but also needs to be insoluble in the electrolyte. Therefore, the selection of suitable materials for both the positive and negative electrodes is crucial. This document presents cases where the components of the binders used in each electrode sheet were identified by measuring the positive electrode binder using TOF-SIMS and the negative electrode binder using GC/MS, and then comparing the results with a materials library database.

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[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing

[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing

We provide one-stop solutions from sample cutting processing to investigating the causes of discoloration and corrosion.

The inner walls of metal pipes, such as SUS, used in various fields can discolor and corrode due to reactions with incoming gases and liquids, leading to a decline in equipment functionality. Understanding the locations prone to discoloration and corrosion, as well as their causes, is an important issue in equipment maintenance. At MST, we provide a comprehensive evaluation from sample cutting to analysis. This document presents a case study of XPS analysis conducted on the inner walls of SUS pipes used in vacuum equipment, highlighting both normal and discolored areas.

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  • Contract Analysis
  • Contract measurement
  • Surface Analysis Equipment

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Accelerating research and development, [new] surface analysis service launched!

Accelerating research and development, [new] surface analysis service launched!

Not only the surface, but also up to a depth of 30nm - Quantitative evaluation of the chemical state at the surface and inside the material at the same location and non-destructively!

We have launched a new service using XPS/HAXPES starting in June! For increasingly complex materials and fine structure samples, we can evaluate the composition and chemical bonding states from the surface to the interior of the material (up to ~30nm) at the same location and in a non-destructive manner. - Depending on the elements of interest and the analysis area and depth, we can select the appropriate X-ray source (Al Kα/Mg Kα/Ga Kα/Cr Kα) to achieve evaluation under suitable measurement conditions. - Non-exposure measurements to the atmosphere, Ar monomer/GCIB sputter etching, and heating pretreatment can be combined. - It is possible to evaluate the electronic states of semiconductor samples using UPS/LEIPS (ionization potential/electron affinity/band gap).

  • Secondary Cells/Batteries
  • Surface Analysis Equipment

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[Analysis Case] Depth Direction State Evaluation of Tin (Sn) Surface

[Analysis Case] Depth Direction State Evaluation of Tin (Sn) Surface

Evaluation of modified layers and altered layers through surface treatment is possible!

TOF-SIMS has good depth resolution and can obtain fragment ions corresponding to bonding states, allowing for the evaluation of layer structures near the surface, within a few nanometers. This document presents a case study analyzing the layer structure of a tin plate surface based on the information obtained from the measurement of standard samples of tin oxide and hydrated tin oxide. By applying this technology, it is possible to evaluate modified layers and altered layers due to surface treatment.

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  • Contract measurement
  • Contract Inspection
  • Surface Analysis Equipment

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Case Study Collection 1 on Surface Analysis (DL Available: XPS/AES/GD-OES)

Case Study Collection 1 on Surface Analysis (DL Available: XPS/AES/GD-OES)

We will introduce examples of surface analysis and measurements using various devices such as XPS, AES, and GD-OES, including measurements of Ni plating thickness, concentration, and surface contamination levels.

In this case study collection, we will introduce examples related to "surface analysis." We cover the objectives, methods, and results of "cleaning evaluation of plating substrates (GD-OES measurement)," as well as the features and analysis cases of "surface contamination analysis using XPS," and the characteristics and analysis cases of "analysis of iron rust (Raman spectroscopy)," among many others. Additionally, we present analysis results, condition analysis, composition measurements, and more. We encourage you to read it. [Contents] ■ Cleaning evaluation of plating substrates (GD-OES measurement) ■ Surface contamination analysis using XPS ■ Condition analysis of copper oxide (XPS/AES analysis) ■ Analysis of iron rust (Raman spectroscopy) ■ Composition investigation of discolored stainless steel *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contract Analysis
  • Surface treatment contract service
  • Surface Analysis Equipment

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Technical Document "Overview of Surface Analysis"

Technical Document "Overview of Surface Analysis"

Technical documentation explaining representative surface analysis methods such as EPMA and AES.

The technical document "Overview of Surface Analysis" contains information on various "surface analysis methods" that have become increasingly important in recent years for product development and addressing defects, focusing on understanding the structure and composition of surfaces and interfaces. This document provides a concise explanation of the fundamental surface analysis techniques, including representative methods such as EPMA, AES, XPS, SIMS, and TOF-SIMS. [Contents] ■ Types and characteristics of surface analysis - EPMA - AES - XPS, etc. For more details, please refer to the catalog or feel free to contact us.

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  • Contract Inspection
  • Surface Analysis Equipment

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